Scope of the Conference is the presentation of the latest investigations on point and extended defects in bulk materials and thin films. Technological applications will be presented alongside fundamental measurements and theories.
The main scientific areas include:
Fundamental physical phenomena
Point and extended defects in wide band-gap systems: oxides, fluorides, nitrides, alkali- and silver-halides, perovskites, minerals, ceramics, nano-structures, organic molecular crystals, glasses, high-k and low-k materials, photonic crystals.
Defects at surfaces and interfaces
Thin films and low-dimensional systems
Colloids, nano-crystals, and aggregates
Defects and material preparation technology
Defects modelling and computational methods
Radiation effects, radiation induced defects, colour centres
Luminescence of excitons, impurities, and defects
Electronic excitations, excited state dynamics, radiative and non-radiative relaxations
Scintillation, energy transfer and storage, carrier trapping phenomena
Non-linear optical phenomena
Laser active centres
Phonons and defects, electron-phonon interactions
Defect diffusion, ionic relaxations, ionic transport
Technological applications
Radiologic imaging and detection, scintillators, and dosimeters
Optical devices and photonics, photorefractive electro-optics, optical fibres, lasers
Materials for micro-electronics
Solid electrolytes, fuel cells, electrochemical sensors, fast ionic conductors
